Streak Unevenness Analysis Device Outline This device measures the brightness unevenness of the entire face using a novel algorithm related to the expression of "unevenness similar to that seen in a light streak." Streak unevenness, which can only be discriminated visually using conventional methods, is expressed numerically using our device. Overall streak unevenness, which is weak and difficult to determine using conventional methods, can be evaluated with acuity equivalent to inspection by eye. Original image Processed image Characteristics Streak unevenness due to weak brightness changes peculiar to LCD is measured and displayed instantly. Streak unevenness can be indicated numerically, which is impossible using conventional methods, due to the original streak unevenness ratio (S-ISC). Complete automation using a trigger signal is possible. In-house inspection standards can be unified as this device can be calibrated with your boundary sample and there is little drift. The data measured and digitized with this device can be displayed as full-color images. Therefore, it may aid in further research and development of your database (brightness and color reference without deterioration). Measurement and numerical indication of evenness of a lattice frame Measurement and numerical indication of ghost signal hidden in noise Measurement and numerical indication of evenness of powder paint material Example of usage Display Film Wafer A Wafer B >>Return to LIST
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